Mikro- ja nanoelektroniikka

publyear: 2015
37-44 / yhteensä 44
vuosirajaus: 2015 - poista vuosirajaus
cover from: Google Books
Handbook of silicon based MEMS materials and technologies
edited by Markku Tilli [and five others] ; contributors, Timo Aalto [and ninety-three others].
2015
295363
isbn:9780323312233
cover from: Google Books
Developments in surface contamination and cleaning. Volume 8, Cleaning techniques
edited by Rajiv Kohli and K.L. Mittal.
2015
307388
isbn:9780323312714|isbn:0323312713
cover from: Google Books
Developments in surface contamination and cleaning. Volume 7, Cleanliness validation and verification
edited by Rajiv Kohli and K.L. Mittal.
2015
307389
isbn:9780323311458|isbn:0323311458
cover from: Google Books
Yang, Bin
Micro and nano energy harvesting technologies
Bin Yang, Huicong Liu, Jingquan Liu, Chengkuo Lee.
2015
307564
isbn:9781608078158|isbn:1608078159|isbn:9781523117406
cover from: Google Books
Wong, E-H.
Robust design of microelectronics assemblies against mechanical shock, temperature and moisture
E.-H. Wong and Y.-W. Mai.
2015
307675
isbn:9780857099112|isbn:0857099116
no cover image
Physics, chemistry and applications of nanostructures : reviews and short notes. Proceedings of International Conference Nanomeeting 2015, Minsk, Belarus, 26-29 May 2015
editors, V.E. Borisenko, S.V. Gaponenko, V.S. Gurin, C.H. Kam.
2015
307760
isbn:9789814696524|isbn:9814696528|isbn:9781680158410|isbn:1680158414
cover from: Google Books
Handbook of silicon based MEMS materials and technologies
edited by Markku Tilli [and others].
2015
307973
isbn:9780323312233|isbn:0323312233
no cover image
ISTFA 2015 : conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA
organized by the Electronic Device Failure Analysis Society.
2015
308355
isbn:9781627081030|isbn:1627081038|isbn:9781523102068|isbn:1523102063
device_type: computer thumb_size: normal
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