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Author: | Dahlgren, Jonas |
Title: | EMC-mittapaikkojen välisten korrelaatiokertoimien määrittely |
Determination of correlation factors between different types of EMC test sites | |
Publication type: | Master's thesis |
Publication year: | 2012 |
Pages: | vii + 61 s. + liitt. 13 Language: fin |
Department/School: | Elektroniikan laitos |
Main subject: | Sovellettu elektroniikka (S-66) |
Supervisor: | Eskelinen, Pekka |
Instructor: | Nyman, Janne ; Nyberg, Tomi |
OEVS: | Electronic archive copy is available via Aalto Thesis Database.
Instructions Reading digital theses in the closed network of the Aalto University Harald Herlin Learning CentreIn the closed network of Learning Centre you can read digital and digitized theses not available in the open network. The Learning Centre contact details and opening hours: https://learningcentre.aalto.fi/en/harald-herlin-learning-centre/ You can read theses on the Learning Centre customer computers, which are available on all floors.
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Location: | P1 Ark Aalto 707 | Archive |
Keywords: | comb-spectrum correlation factor monopole measurement uncertainty reference radiator spectrum analyzer CISPR EMC EUT FAR kampaspektri korrelaatiokerroin LabVIEW mittausepävarmuus monopoli referenssisäteilijä SAR spektrianalysaattori |
ED: | 2012-07-09 |
INSSI record number: 45012
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