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Author: | Porteus, E. L. |
Title: | The impact of inspection delay on process and inspection lot sizing. |
Journal: | Management Science
1990 : AUG, VOL. 36:8, p. 999-1007 |
Index terms: | LOT-SIZE MODEL QUALITY CONTROL INVENTORY CONTROL |
Language: | eng |
Abstract: | Models in which process quality and lot sizing interact have recently been developed. Lot sizes should be reduced to compensate for poor quality if no effective inspection is possible. An inspection delay time is introduced which is measured in units produced after an inspection is made until results are known. The impact of the results is illustrated numerically. The value of automated defect control is discussed. |
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