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| Author: | Whitmore, G. Young, D. Kimber, A. |
| Title: | Two-stage reliability tests with technological evolution: a Bayesian analysis |
| Journal: | Applied Statistics
1994 : VOL. 43:2, p. 295-308 |
| Index terms: | TECHNOLOGY RELIABILITY POISSON DISTRIBUTION |
| Language: | eng |
| Abstract: | The reliability of equipment is of interest to manufacturers. Frequently minor modifications are made to devices and there is insufficient time to test these modified devices fully before they must enter service. The problem of interest here is how we can use the information already obtained from the testing of a device before modification to help us to evaluate the reliability of the modified device. |
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