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| Author: | Loch, C. Stein, L. Terwiesch, C. |
| Title: | Measuring development performance in the electronics industry |
| Journal: | Journal of Product Innovation Management
1996 : JAN, VOL. 13:1, p. 3-20 |
| Index terms: | MEASUREMENT DEVELOPMENT ELECTRONICS INDUSTRY |
| Language: | eng |
| Abstract: | Within a year or so, the computer you purchased last month will probably be obsolete. For a manufacturer faced with such short product life-cycles, the performance of the new product development (NPD) function can determine whether the firm itself is relegated to the scrap heap. With such a close link between NPD performance and a firm's overall success, we need to do more than simply ensure that individual projects are well managed; we need to assess NPD's overall contribution to the company's business performance. |
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