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Author:Cheng, C. S.
Title:A neural network approach for the analysis of control chart patterns
Journal:International Journal of Production Research
1997 : MAR, VOL. 35:3, p. 667-697
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Freeterms:STATISTISCHE QUALITÄTSKONTROLLE
Language:eng
Abstract:Control chart pattern recognition is an important aspect of statistical process control (SPC). The presence of unnatural patterns indicates that a process is affected by assignable causes, and corrective actions should be taken. This paper describes two types of pattern recognizers based on different neural network architectures: a multilayer perception trained by back propagation and a modular neural network. Identification of unnatural patterns can greatly narrow the causes that must be investigated, and thus the diagnostic search could be reduced in length.
SCIMA record nr: 163675
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