search query: @indexterm MICROELECTRONICS INDUSTRY / total: 93
reference: 36 / 93
| Author: | Feo, T. A. Hochbaum, D. S. |
| Title: | Lagrangian relaxation for testing infeasibility in VLSI routing. |
| Journal: | Operations Research
1986 : NOV-DEC, VOL. 34:6, p. 819-831 |
| Index terms: | OPERATIONAL RESEARCH MICROELECTRONICS INDUSTRY |
| Language: | eng |
| Abstract: |
SCIMA