haku: @author Akella, R. / yhteensä: 6
viite: 5 / 6
| Tekijä: | Akella, R. Rajagoplan, S. Singh, M. R. |
| Otsikko: | Part dispatch in random yield multistage flexible test systems for printed circuit boards |
| Lehti: | Operations Research
1992 : JUL-AUG, VOL. 40:4, p. 776-789 |
| Asiasana: | INVENTORY CONTROL ELECTRONICS INDUSTRY QUALITY CONTROL TESTS RESOURCE ALLOCATION |
| Kieli: | eng |
| Tiivistelmä: | Dynamic part dispatch decisions in electronic test systems with random yield are examined. A discrete time, multiroduct, multistage production system is used as a model for the test system with the objective to minimize the sum of inventory holding, backlogging, and overtime costs over a finite horizon. Exact results for such systems have been limited to either single-stage, multiple time period, or multistage, single time period problems with a single product. Here the linear decision rule and the myopic resource allocation are developed as approximate policies. |
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