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| Author: | Seppälä, Veera Inkeri |
| Title: | Improving the Utilization of Statistical Failure Models in Component Level Testing |
| Tilastollisten vikamallien käytön kehittäminen komponenttien testauksessa | |
| Publication type: | Master's thesis |
| Publication year: | 2016 |
| Pages: | 72+9 Language: eng |
| Department/School: | Sähkötekniikan korkeakoulu |
| Main subject: | Elektroniikka ja sovellukset (S3007) |
| Supervisor: | Paulasto-Kröckel, Mervi |
| Instructor: | Kärkäs, Reijo |
| Electronic version URL: | http://urn.fi/URN:NBN:fi:aalto-201606172445 |
| Location: | P1 Ark Aalto 4262 | Archive |
| Keywords: | PAT MEMS statistical screening testing tilastollinen kritisointi testaus |
| ED: | 2016-07-17 |
INSSI record number: 53877
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