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Author: | Pekkola, Jan |
Title: | Characterization of the ESD properties of a BeCMOS technology |
Erään BeCMOS-teknologian ESD-ominaisuuksien karakterisointi | |
Publication type: | Master's thesis |
Publication year: | 2001 |
Pages: | xii + 77 Language: eng |
Department/School: | Sähkö- ja tietoliikennetekniikan osasto |
Main subject: | Elektronifysiikka (S-69) |
Supervisor: | Kuivalainen, Pekka |
Instructor: | Mellin, Jussi |
Digitized copy: | https://aaltodoc.aalto.fi/handle/123456789/89355 |
OEVS: | Digitized archive copy is available in Aaltodoc
|
Location: | P1 Ark S80 | Archive |
Keywords: | ESD characterization CMOS TLP parameter extraction test structure ESD-karakterisointi parametrien määrittäminen testirakenne |
ED: | 2002-01-09 |
INSSI record number: 18194
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