search query: @keyword test structure / total: 3
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| Author: | Pekkola, Jan |
| Title: | Characterization of the ESD properties of a BeCMOS technology |
| Erään BeCMOS-teknologian ESD-ominaisuuksien karakterisointi | |
| Publication type: | Master's thesis |
| Publication year: | 2001 |
| Pages: | xii + 77 Language: eng |
| Department/School: | Sähkö- ja tietoliikennetekniikan osasto |
| Main subject: | Elektronifysiikka (S-69) |
| Supervisor: | Kuivalainen, Pekka |
| Instructor: | Mellin, Jussi |
| Digitized copy: | https://aaltodoc.aalto.fi/handle/123456789/89355 |
| OEVS: | Digitized archive copy is available in Aaltodoc
|
| Location: | P1 Ark S80 | Archive |
| Keywords: | ESD characterization CMOS TLP parameter extraction test structure ESD-karakterisointi parametrien määrittäminen testirakenne |
| ED: | 2002-01-09 |
INSSI record number: 18194
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