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Author: | Vesterinen, Visa |
Title: | Scanning Tunneling Microscopy Characterization of the CaF2/Si(001) Interface |
Publication type: | Bachelor's thesis |
Publication year: | 2010 |
Pages: | 22 Language: eng |
Department/School: | Informaatio- ja luonnontieteiden tiedekunta |
Degree programme: | Teknillisen fysiikan ja matematiikan tutkinto-ohjelma |
Main subject: | Teknillinen fysiikka (F3005) |
Supervisor: | Nieminen, Risto |
Instructor: | Pinto, Henry |
Electronic version URL: | http://urn.fi/URN:NBN:fi:aalto-201305164944 |
Location: | |
Keywords: | computational physics silicon calcium difluoride scanning tunneling microscopy electronic structure density functional theory |
ED: | 2011-05-10 |
INSSI record number: 41944
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