search query: @keyword failure analysis / total: 6
reference: 1 / 6
« previous | next »
| Author: | Banh, Cuong |
| Title: | MEMS-komponenttien luotettavuus ja vaurioanalyysi |
| The reliability and failure analysis of MEMS components | |
| Publication type: | Master's thesis |
| Publication year: | 2016 |
| Pages: | (7) + 91 Language: fin |
| Department/School: | Sähkötekniikan korkeakoulu |
| Main subject: | Elektroniikka ja sovellukset (S3007) |
| Supervisor: | Paulasto-Kröckel, Mervi |
| Instructor: | Vuorinen, Vesa |
| Electronic version URL: | http://urn.fi/URN:NBN:fi:aalto-201611025477 |
| Location: | P1 Ark Aalto 5069 | Archive |
| Keywords: | Micro-Electro-Mechanical System MEMS market MEMS devices environment factors reliability failure analysis mikroelektromekaaninen järjestelmä luotettavuus vaurioanalyysi ympäristörasitustekijät MEMS-markkinat |
| ED: | 2016-11-13 |
INSSI record number: 55008
+ add basket
« previous | next »
INSSI